BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods - Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods - Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
£2000.00
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